Design of Radiation Hardened Latch and Flip-Flop with Cost-Effectiveness for Low-Orbit Aerospace Applications

An Innovative Radiation Hardened By Design Flip - Flop

i ABSTRACT Radiation hardening by design (RHBD) has become a necessary practice when creating circuits to operate within radiated environments. While employing RHBD techniques has tradeoffs between size, speed and power, novel designs help to minimize these penalties. Space radiation is the primary source of radiation errors in circuits and two types of single event effects, single event upsets...

A novel radiation hardened by design latch ∗

Due to aggressive technology scaling, radiation-induced soft errors have become a serious reliability concern in VLSI chip design. This paper presents a novel radiation hardened by design latch with high single-eventupset (SEU) immunity. The proposed latch can effectively mitigate SEU by internal dual interlocked scheme. The propagation delay, power dissipation and power delay product of the pr...

Low cost and highly reliable radiation hardened latch design in 65 nm

Low cost and highly reliable radiation hardened latch design in 65 nm CMOS technology

As a consequence of technology scaling down, gate capacitances and stored charge in sensitive nodes are decreasing rapidly, which makes CMOS circuits more vulnerable to radiation induced soft errors. In this paper, a low cost and highly reliable radiation hardened latch is proposed using 65 nm CMOS commercial technology. The proposed latch can fully tolerate the single event upset (SEU) when pa...

Metastability of CMOS Latch/Flip-Flop

This paper presents several design issues of CMOS latch/flipflops for meta-stable hardness in terms of optimal device size, aspect ratio, and configurations by using the AC small signal analysis in the frequency domain rather than the time domain. This new design approach is verified experimentally. The power supply disturbance and temperature variation effects on the metastability are measured...